专利名称：APPARATUS AND METHOD FOR
EVALUATING STATISTICAL INTERFERENCECONCERNING MULTI-SOURCE NOISEENVIRONMENT OF ELECTROMAGNETICZONE
发明人：Su Na CHOI,Seung Keun PARK申请号：US13911501申请日：20130606
公开号：US20140148113A1公开日：20140529
专利附图：
摘要：An apparatus and method for evaluating statistical interference concerning amulti-source noise environment of an electromagnetic (EM) zone are disclosed. Theapparatus for evaluating statistical interference may include a receiver to receive an EMwave in a preset frequency band, a spectrum analyzer to analyze the received EM waveand to measure interference in the preset frequency band, a frequency selector to selectan interest frequency in the frequency band based on a level of the measured
interference, an amplitude probability distribution (APD) measurement unit to measurean APD of an interference signal with respect to the interest frequency, and a comparatorto compare the measured APD to a preset limit and to draw a probability of the limit orhigher of interference occurring.
申请人：Electronics and Telecommunications Research Institute
地址：Daejeon KR
国籍：KR
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容