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MONITORING METHOD, MONITORING APPARATUS, AND ELECT

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专利名称:MONITORING METHOD, MONITORING

APPARATUS, AND ELECTRONIC DEVICE

发明人:Zhong, Shichun,Luo, Yanbin申请号:EP15165639.4申请日:20150429公开号:EP2942714B1公开日:20161228

摘要:Embodiments of the present invention, which relate to the field of electronictechnologies, provide a monitoring method, a monitoring apparatus, and an electronicdevice, which can accurately locate an error point in MPI information delivered by asystem chip. The apparatus may include: an address filter, a read/write controllerconnected to the address filter, and a memory connected to the read/write controller,where the address filter is configured to acquire multiple pieces of MPI information, andobtain, by filtering the multiple pieces of MPI information, first MPI informationcorresponding to a first service that is preset; the read/write controller is configured towrite, into the memory according to a time sequence of receiving the first MPI

information, the first MPI information that is obtained by the address filter by filtering;and the memory is configured to store the first MPI information written by theread/write controller.

申请人:HUAWEI TECH CO LTD

地址:CN

国籍:CN

代理机构:Gill Jennings & Every LLP

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