专利名称：BUFFER CIRCUIT WITH ADAPTIVE REPAIR
CAPABILITY
发明人：Scott C. Best,John Eric Linstadt,Paul William
Roukema
申请号：US15506621申请日：20150817
公开号：US20170287571A1公开日：20171005
专利附图：
摘要：A buffer circuit is disclosed. The buffer circuit includes a command address (C/A)interface to receive an incoming activate (ACT) command and an incoming column address
strobe (CAS) command. A first match circuit includes first storage to store failure rowaddress information associated with the memory, and first compare logic. The firstcompare logic is responsive to the ACT command, to compare incoming row addressinformation to the stored failure row address information. A second match circuitincludes second storage to store failure column address information associated with thememory, and second compare logic. The second compare logic is responsive to the CAScommand, to compare the incoming column address information to the stored failurecolumn address information. Gating logic maintains a state of a matching row addressidentified by the first compare logic during the comparison carried out by the secondcompare logic.
申请人：Rambus Inc.
地址：Sunnyvale CA US
国籍：US
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